Interaction of the Electromagnetic p-Waves with Thin Metal Films
classification
🧮 math-ph
math.MPphysics.optics
keywords
filmsthicknessreflectionthinabsorbtionallowsanalysisanalytical
read the original abstract
For the first time it is shown that for thin metallic films thickness of which not exceed thickness of skin-layer, the problem allows analytical solution for arbitrary boundary value problems. The analysis of dependence of coefficients of transmission, reflection and absorbtion on angle incidence, thickness of films and coefficient of specular reflection is carried out.
This paper has not been read by Pith yet.
discussion (0)
Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.