pith. sign in

arxiv: 1809.05934 · v2 · pith:L7AKC5Z4new · submitted 2018-09-16 · 💻 cs.CV · cs.LG

Maximum-Entropy Fine-Grained Classification

classification 💻 cs.CV cs.LG
keywords classificationtrainingfgvcfine-grainedamountdatadifferentdiversity
0
0 comments X
read the original abstract

Fine-Grained Visual Classification (FGVC) is an important computer vision problem that involves small diversity within the different classes, and often requires expert annotators to collect data. Utilizing this notion of small visual diversity, we revisit Maximum-Entropy learning in the context of fine-grained classification, and provide a training routine that maximizes the entropy of the output probability distribution for training convolutional neural networks on FGVC tasks. We provide a theoretical as well as empirical justification of our approach, and achieve state-of-the-art performance across a variety of classification tasks in FGVC, that can potentially be extended to any fine-tuning task. Our method is robust to different hyperparameter values, amount of training data and amount of training label noise and can hence be a valuable tool in many similar problems.

This paper has not been read by Pith yet.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.

Forward citations

Cited by 2 Pith papers

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score.

  1. Diversity in Large Language Models under Supervised Fine-Tuning

    cs.LG 2026-04 unverdicted novelty 6.0

    TOFU loss mitigates the narrowing of generative diversity in LLMs after supervised fine-tuning by addressing neglect of low-frequency patterns and forgetting of prior knowledge.

  2. Diversity in Large Language Models under Supervised Fine-Tuning

    cs.LG 2026-04 unverdicted novelty 5.0

    Supervised fine-tuning narrows LLM generative diversity through neglect of low-frequency patterns and knowledge forgetting, but the TOFU loss mitigates this effect across models and benchmarks.