PICTS: A Novel Deep Reinforcement Learning Approach for Dynamic P-I Control in Scanning Probe Microscopy
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classification
cond-mat.mtrl-sci
cs.LGphysics.app-ph
keywords
controldeeplearningmicroscopyprobereinforcementscanningadjust
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We have developed a Parallel Integrated Control and Training System, leveraging the deep reinforcement learning to dynamically adjust the control strategies in real time for scanning probe microscopy techniques.
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