pith. machine review for the scientific record. sign in

arxiv: 1209.0268 · v1 · submitted 2012-09-03 · 🪐 quant-ph · cond-mat.mes-hall· physics.atom-ph

Recognition: unknown

Photo induced ionization dynamics of the nitrogen vacancy defect in diamond investigated by single shot charge state detection

Authors on Pith no claims yet
classification 🪐 quant-ph cond-mat.mes-hallphysics.atom-ph
keywords statecentrechargesingledetaileddiamonddynamicsexcitation
0
0 comments X
read the original abstract

The nitrogen-vacancy centre (NV) has drawn much attention for over a decade, yet detailed knowledge of the photophysics needs to be established. Under typical conditions, the NV can have two stable charge states, negative (NV-) or neutral (NV0), with photo induced interconversion of these two states. Here, we present detailed studies of the ionization dynamics of single NV centres in bulk diamond at room temperature during illumination in dependence of the excitation wavelength and power. We apply a recent method which allows us to directly measure the charge state of a single NV centre, and observe its temporal evolution. Results of this work are the steady state NV- population, which was found to be always < 75% for 450 to 610 nm excitation wavelength, the relative absorption cross-section of NV- for 540 to 610 nm, and the energy of the NV- ground state of 2.6 eV below the conduction band. These results will help to further understand the photo-physics of the NV centre.

This paper has not been read by Pith yet.

discussion (0)

Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.

Forward citations

Cited by 1 Pith paper

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score.

  1. Exploiting ionization dynamics in the nitrogen vacancy center for rapid, high-contrast spin and charge state initialization

    quant-ph 2026-05 conditional novelty 5.0

    A two-step optical protocol using charge state dynamics boosts NV center spin contrast by 17% and reduces initialization error by over 50%.