REVIEW 1 cited by
Artificial Intelligence Technology analysis using Artificial Intelligence patent through Deep Learning model and vector space model
Not yet reviewed by Pith; the record is open.
This paper has not been read by Pith yet. Machine review is queued; the pith claim, tier, and objections will appear here once it completes.
SPECIMEN: schema-true, not a live event
T0 review · schema-true
One-sentence machine reading of the paper's core claim.
pith:XXXXXXXX · record.json · timestamp
Signed reviews
read the original abstract
Thanks to rapid development of artificial intelligence technology in recent years, the current artificial intelligence technology is contributing to many part of society. Education, environment, medical care, military, tourism, economy, politics, etc. are having a very large impact on society as a whole. For example, in the field of education, there is an artificial intelligence tutoring system that automatically assigns tutors based on student's level. In the field of economics, there are quantitative investment methods that automatically analyze large amounts of data to find investment laws to create investment models or predict changes in financial markets. As such, artificial intelligence technology is being used in various fields. So, it is very important to know exactly what factors have an important influence on each field of artificial intelligence technology and how the relationship between each field is connected. Therefore, it is necessary to analyze artificial intelligence technology in each field. In this paper, we analyze patent documents related to artificial intelligence technology. We propose a method for keyword analysis within factors using artificial intelligence patent data sets for artificial intelligence technology analysis. This is a model that relies on feature engineering based on deep learning model named KeyBERT, and using vector space model. A case study of collecting and analyzing artificial intelligence patent data was conducted to show how the proposed model can be applied to real world problems.
Forward citations
Cited by 1 Pith paper
-
KLIPA: A Knowledge Graph and LLM-Driven QA Framework for IP Analysis
KLIPA integrates a Neo4j knowledge graph, RAG, and a ReAct agent for patent QA, and shows VQA-based graph construction beats OCR+LLM on extraction metrics.
Discussion (0). Continue with ORCID to comment.