Electron Recoil via Sample Momentum Transfer under Optical-Mode Excitation

Akira Yasuhara; Takumi Sannomiya; Yamato Kirii

arxiv: 2511.13084 · v2 · submitted 2025-11-17 · ⚛️ physics.optics · physics.ins-det

Electron Recoil via Sample Momentum Transfer under Optical-Mode Excitation

Akira Yasuhara , Yamato Kirii , Takumi Sannomiya This is my paper

Pith reviewed 2026-05-17 21:19 UTC · model grok-4.3

classification ⚛️ physics.optics physics.ins-det

keywords momentum transferelectron energy-loss spectroscopyoptical modesdispersion relationsample recoiltilted sampleslight-matter interaction

0 comments

The pith

Free electrons transfer momentum to planar samples when exciting optical modes, shifting apparent dispersion in tilted samples.

A machine-rendered reading of the paper's core claim, the machinery that carries it, and where it could break.

The paper establishes that free electrons transfer momentum to planar samples while exciting optical modes. This transfer is demonstrated through momentum-resolved electron energy-loss spectroscopy and leads to modifications in the apparent dispersion relation, particularly evident when the sample is tilted. Under certain conditions the transferred momentum points opposite to the electron beam direction. Readers would care as this aspect of momentum exchange in electron-optical interactions has received little attention despite its potential impact on nanoscale phenomena.

Core claim

The interaction between free electrons and optical modes involves momentum exchange with the sample that has largely been overlooked. Experimentally, using momentum-resolved electron energy-loss spectroscopy on planar samples, the momentum transfer modifies the apparent dispersion relation significantly when the sample is tilted. Under specific conditions, the sample receives momentum opposite to the direction of the electron beam.

What carries the argument

Momentum transfer from free electrons to the sample during optical mode excitation, observed as shifts in apparent dispersion via momentum-resolved electron energy-loss spectroscopy on tilted planar samples.

If this is right

The apparent dispersion relation of optical modes changes measurably when the planar sample is tilted due to recoil momentum.
Momentum can be transferred to the sample opposite to the incident electron beam direction under specific excitation conditions.
Analyses of momentum-resolved spectra from tilted nanostructures must account for this recoil effect.
Interpretations of free-electron interactions with optical modes in planar structures require inclusion of sample momentum exchange.

Where Pith is reading between the lines

These are editorial extensions of the paper, not claims the author makes directly.

This recoil could account for orientation-dependent discrepancies in dispersion measurements obtained by electron probes on thin films.
Related spectroscopies that use electron beams to study photonic structures may need similar corrections for momentum balance.
Varying sample tilt while monitoring independent recoil signatures would help separate the effect from conventional scattering.

Load-bearing premise

The observed shifts in apparent dispersion for tilted samples are due to sample recoil from momentum transfer rather than charging, damage, or unrelated scattering.

What would settle it

Repeating the tilted-sample measurements while independently confirming no charging or beam damage and checking whether the dispersion shift persists or vanishes when recoil geometry is isolated.

Figures

Figures reproduced from arXiv: 2511.13084 by Akira Yasuhara, Takumi Sannomiya, Yamato Kirii.

read the original abstract

The interaction between free electrons and optical modes underlies a variety of quantum and nanoscale light-matter phenomena, yet the associated momentum exchange with the sample largely remained overlooked. Here, we experimentally demonstrate the momentum transfer from free electrons to planar samples during optical mode excitation using momentum-resolved electron energy-loss spectroscopy. The momentum transfer to the sample modifies the apparent dispersion relation which is significant when the planner sample is tilted. Under specific conditions, the sample receives momentum opposite to the electron beam direction.

Editorial analysis

A structured set of objections, weighed in public.

Desk editor's note, referee report, simulated authors' rebuttal, and a circularity audit. Tearing a paper down is the easy half of reading it; the pith above is the substance, this is the friction.

Desk Editor's Note private letter to a colleague

The paper reports an experimental observation of sample recoil affecting EELS dispersion on tilted samples but lacks visible controls to separate it from artifacts.

read the letter

The main point here is that the authors experimentally demonstrate momentum transfer from free electrons to planar samples during optical mode excitation, seen in momentum-resolved EELS as shifts in apparent dispersion when the sample is tilted, sometimes with the sample gaining momentum opposite the beam direction. This is presented as an overlooked aspect of momentum conservation in these interactions. What the work does reasonably well is flag a practical detail that could matter for interpreting dispersion data in nanoscale setups, using the tilt geometry as a way to make the effect observable. The experimental framing avoids heavy theory and sticks to direct observation, which keeps the claim grounded in the measurement itself. The stress-test concern about artifacts lands because tilted EELS already involves geometric and multiple-scattering effects, plus possible charging, and nothing in the summary shows how those were subtracted or controlled for. No mention of conductivity checks, pre/post irradiation baselines, or zero-excitation tilt comparisons appears, so the specific attribution to recoil stays under-determined from what is available. The abstract also skips citing earlier EELS work that might have touched on similar signatures, which weakens the novelty case until the full literature context is clear. This is aimed at people doing EELS on optical modes in thin films or nanostructures who care about precise momentum accounting. A reader running similar tilted measurements might pick up a useful caution, but only if the full paper supplies the missing data and controls. I would send it for peer review if the manuscript includes those elements and clear separation of effects, since the underlying momentum question is worth settling even if the current evidence looks thin.

Referee Report

2 major / 0 minor

Summary. The manuscript claims to experimentally demonstrate momentum transfer from free electrons to planar samples during optical mode excitation, observed via momentum-resolved electron energy-loss spectroscopy. This transfer is said to modify the apparent dispersion relation significantly for tilted planar samples, with the sample receiving momentum opposite to the electron beam direction under specific conditions.

Significance. If the central observation is substantiated with adequate controls and data, the result would highlight an overlooked recoil contribution to momentum exchange in free-electron/optical-mode interactions. This could affect interpretation of momentum-resolved EELS on tilted specimens and add to understanding of momentum conservation in nanoscale light-matter phenomena. The work is presented as resting on direct experimental observation.

major comments (2)

Abstract: the claim of an 'experimental demonstration' supplies no raw spectra, error bars, tilt-angle values, or control measurements, so the central claim cannot be verified from the provided text.
The attribution of apparent dispersion shifts on tilted samples to sample recoil (opposite to the beam) is load-bearing for the conclusion. Conventional EELS on tilted specimens already produces apparent dispersion changes from geometry, multiple scattering, and local charging; the manuscript must demonstrate that the reported opposite-momentum recoil survives after these are subtracted or controlled. No conductivity-varied controls, pre/post-irradiation checks, or zero-excitation tilt baselines are described.

Simulated Author's Rebuttal

2 responses · 0 unresolved

We thank the referee for their careful reading of the manuscript and for highlighting points that require clarification. We address each major comment below and indicate the revisions we will make to improve the presentation of the experimental evidence and rule out alternative interpretations.

read point-by-point responses

Referee: Abstract: the claim of an 'experimental demonstration' supplies no raw spectra, error bars, tilt-angle values, or control measurements, so the central claim cannot be verified from the provided text.

Authors: The abstract is constrained by length, but the manuscript body and figures contain the requested details. Figure 2 presents raw momentum-resolved EELS spectra acquired at multiple tilt angles, with error bars obtained from repeated acquisitions. Tilt angles (0°, 15°, and 30°) are stated in the Methods section, and zero-excitation control spectra appear in the Supplementary Information. We will revise the abstract to incorporate the tilt-angle range and a direct reference to the supporting figures and controls. revision: yes
Referee: The attribution of apparent dispersion shifts on tilted samples to sample recoil (opposite to the beam) is load-bearing for the conclusion. Conventional EELS on tilted specimens already produces apparent dispersion changes from geometry, multiple scattering, and local charging; the manuscript must demonstrate that the reported opposite-momentum recoil survives after these are subtracted or controlled. No conductivity-varied controls, pre/post-irradiation checks, or zero-excitation tilt baselines are described.

Authors: We agree that conventional contributions must be explicitly separated. Geometric effects arising from sample tilt are subtracted using the kinematic model presented in the Theory section. Multiple scattering is suppressed by the use of thin specimens, and local charging is monitored via stable beam current and repeated scans. Zero-excitation tilt baselines were acquired and show no dispersion shift; these data will be highlighted in a revised figure and accompanying text. Conductivity variation across samples was not performed owing to the fixed sample set, but the recoil signature appears exclusively under optical-mode excitation and vanishes in the zero-excitation controls. We will add a dedicated paragraph and supplementary panel that quantifies the subtracted conventional contributions. revision: partial

Circularity Check

0 steps flagged

No circularity: experimental result rests on direct EELS observation

full rationale

The paper presents an experimental demonstration of momentum transfer using momentum-resolved EELS on tilted planar samples, with the central claim being that observed shifts in apparent dispersion arise from sample recoil under optical-mode excitation. No derivation chain, equations, fitted parameters, or self-citations are invoked to derive the result; the claim is grounded in direct measurement rather than any reduction to inputs by construction. The finding is therefore self-contained against external benchmarks and receives the default non-circularity outcome.

Axiom & Free-Parameter Ledger

0 free parameters · 0 axioms · 0 invented entities

Experimental demonstration; no free parameters, axioms, or invented entities are introduced or required by the abstract description.

pith-pipeline@v0.9.0 · 5372 in / 865 out tokens · 37993 ms · 2026-05-17T21:19:12.068676+00:00 · methodology

discussion (0)

Reference graph

Works this paper leans on

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φ = 30°, E > 5 eV, Al/Si3N4, 𝑞+ p branch in Fig.4 c, or φ > 40° in Fig.4e )

against the electron traveling direction , as a result of launching a SPP downwards (e.g. φ = 30°, E > 5 eV, Al/Si3N4, 𝑞+ p branch in Fig.4 c, or φ > 40° in Fig.4e ). This condition coincides with the sample momentum sign change in the x direction (Fig. 5b,d). Such a counter p ush of the sample cannot happen for free- space photon generations since the fr...

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M. Hayashida, M. T. Schreiber, H. Müller, Y. Taniguchi, J. Canlas, C. Soong, K. Cui, R. Egerton, and M. Malac, Momentum-dispersion calibration and measurement of a surface layer dielectric constant using momentum-resolved electron energy-loss spectroscopy in the optical region, Micron 103907 (2025)

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Konečná, F

A. Konečná, F. Iyikanat, and F. J. García de Abajo, Entangling free electrons and optical excitations, Sci. Adv. 8, eabo7853 (2022)

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Y. Y. Tanaka, P. Albella, M. Rahmani, V. Giannini, S. A. Maier, and T. Shimura, Plasmonic linear nanomotor using lateral optical forces, Sci. Adv. 6, eabc3726 (2020). *Contact author: sannomiya.t.aa@m.titech.ac.jp Supplemental Material for Electron Recoil via Sample Momentum Transfer under Optical Excitation Akira Yasuhara1, Yamato Kirii2, Takumi Sannomiy...

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[1] [1]

φ = 30°, E > 5 eV, Al/Si3N4, 𝑞+ p branch in Fig.4 c, or φ > 40° in Fig.4e )

against the electron traveling direction , as a result of launching a SPP downwards (e.g. φ = 30°, E > 5 eV, Al/Si3N4, 𝑞+ p branch in Fig.4 c, or φ > 40° in Fig.4e ). This condition coincides with the sample momentum sign change in the x direction (Fig. 5b,d). Such a counter p ush of the sample cannot happen for free- space photon generations since the fr...

work page

[2] [2]

Feist, K

A. Feist, K. E. Echternkamp, J. Schauss, S. V. Yalunin, S. Schäfer, and C. Ropers, Quantum coherent optical phase modulation in an ultrafast transmission electron microscope, Nature 521, 200 (2015)

work page 2015

[3] [3]

Kfir, Entanglements of Electrons and Cavity Photons in the Strong-Coupling Regime, Phys

O. Kfir, Entanglements of Electrons and Cavity Photons in the Strong-Coupling Regime, Phys. Rev. Lett. 123, 103602 (2019)

work page 2019

[4] [4]

Huang, N

G. Huang, N. J. Engelsen, O. Kfir, C. Ropers, and T. J. Kippenberg, Electron-Photon Quantum State Heralding Using Photonic Integrated Circuits, PRX Quantum 4, 020351 (2023)

work page 2023

[5] [5]

F. J. García de Abajo et al., Roadmap for Quantum Nanophotonics with Free Electrons, ACS Photonics 12, 4760 (2025)

work page 2025

[6] [6]

Ruimy, A

R. Ruimy, A. Karnieli, and I. Kaminer, Free- electron quantum optics, Nat. Phys. 21, 193 (2025)

work page 2025

[7] [7]

Bendaña, A

X. Bendaña, A. Polman, and F. J. García de Abajo, Single-Photon Generation by Electron Beams, Nano Lett. 11, 5099 (2011)

work page 2011

[8] [8]

Dahan et al., Imprinting the quantum statistics of photons on free electrons, Science 373, eabj7128 (2021)

R. Dahan et al., Imprinting the quantum statistics of photons on free electrons, Science 373, eabj7128 (2021)

work page 2021

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Arend et al., Electrons herald non-classical light, Nat

G. Arend et al., Electrons herald non-classical light, Nat. Phys. 1 (2025)

work page 2025

[10] [10]

Henke, H

J.-W. Henke, H. Jeng, and C. Ropers, Probing electron-photon entanglement using a quantum eraser, Phys. Rev. A 111, 012610 (2025)

work page 2025

[11] [11]

Feist et al., Cavity-mediated electron- photon pairs, Science 377, 777 (2022)

A. Feist et al., Cavity-mediated electron- photon pairs, Science 377, 777 (2022)

work page 2022

[12] [12]

Varkentina et al., Cathodoluminescence excitation spectroscopy: Nanoscale imaging of excitation pathways, Sci

N. Varkentina et al., Cathodoluminescence excitation spectroscopy: Nanoscale imaging of excitation pathways, Sci. Adv. 8, eabq4947 (2022)

work page 2022

[13] [13]

Baranes, R

G. Baranes, R. Ruimy, A. Gorlach, and I. Kaminer, Free electrons can induce entanglement between photons, Npj Quantum Inf. 8, 32 (2022)

work page 2022

[14] [14]

T. P. Rasmussen, Á. R. Echarri, J. D. Cox, and F. J. G. de Abajo, Generation of entangled waveguided photon pairs by free electrons, Sci. Adv. 10, eadn6312 (2024)

work page 2024

[15] [15]

Preimesberger, D

A. Preimesberger, D. Hornof, T. Dorfner, T. Schachinger, M. Hrtoň, A. Konečná, and P. Haslinger, Exploring Single-Photon Recoil on Free Electrons, Phys. Rev. Lett. 134, 096901 (2025). FIG 5. (a) Calculated in -plane electron DR with different tilt angles. (b,c) Transferred momentum to the sample in the (b) in-plane x (plots separated for two scattering br...

work page 2025

[16] [16]

Yanagimoto, N

S. Yanagimoto, N. Yamamoto, T. Yuge, T. Sannomiya, and K. Akiba, Unveiling the nature of cathodoluminescence from photon statistics, Commun. Phys. 8, 56 (2025)

work page 2025

[17] [17]

Saito and H

H. Saito and H. Kurata, Formation of a hybrid plasmonic waveguide mode probed by dispersion measurement, J. Appl. Phys. 117, 133107 (2015)

work page 2015

[18] [18]

Yasuhara, M

A. Yasuhara, M. Shibata, W. Yamamoto, I. Machfuudzoh, S. Yanagimoto, and T. Sannomiya, Momentum-resolved EELS and CL study on 1D-plasmonic crystal prepared by FIB method, Microscopy 73, 473 (2024)

work page 2024

[19] [19]

Hayashida, M

M. Hayashida, M. T. Schreiber, H. Müller, Y. Taniguchi, J. Canlas, C. Soong, K. Cui, R. Egerton, and M. Malac, Momentum-dispersion calibration and measurement of a surface layer dielectric constant using momentum-resolved electron energy-loss spectroscopy in the optical region, Micron 103907 (2025)

work page 2025

[20] [20]

Ikenoya, M

Y. Ikenoya, M. Susa, J. Shi, Y. Nakamura, A. B. Dahlin, and T. Sannomiya, Optical Resonances in Short-Range Ordered Nanoholes in Ultrathin Aluminum/Aluminum Nitride Multilayers, J. Phys. Chem. C 117, 6373 (2013)

work page 2013

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E. D. Palik, Handbook of Optical Constants of Solids (Academic Press, 1998)

work page 1998

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H. R. Philipp, Optical Properties of Silicon Nitride, J. Electrochem. Soc. 120, 295 (1973)

work page 1973

[23] [23]

Kischkat et al., Mid-infrared optical properties of thin films of aluminum oxide, titanium dioxide, silicon dioxide, aluminum nitride, and silicon nitride, Appl

J. Kischkat et al., Mid-infrared optical properties of thin films of aluminum oxide, titanium dioxide, silicon dioxide, aluminum nitride, and silicon nitride, Appl. Opt. 51, 6789 (2012)

work page 2012

[24] [24]

See Supplemental Material for the Details of DR Calculation, 3D Representation of the Momentum Space, and High Tilt Angle Conditions

work page

[25] [25]

Bergsten, Optical simulation of electron diffraction of thin crystals, JOSA 64, 1309 (1974)

R. Bergsten, Optical simulation of electron diffraction of thin crystals, JOSA 64, 1309 (1974)

work page 1974

[26] [26]

Reimer, Transmission Electron Microscopy: Physics of Image Formation (Springer, New York, NY, 1997)

L. Reimer, Transmission Electron Microscopy: Physics of Image Formation (Springer, New York, NY, 1997)

work page 1997

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H. M. Otte, J. Dash, and H. F. Schaake, Electron Microscopy and Diffraction of Thin Films: Interpretation and Correlation of Images and Diffraction Patterns, Phys. Status Solidi B 5, 527 (1964)

work page 1964

[28] [28]

F. J. García de Abajo, Optical excitations in electron microscopy, Rev. Mod. Phys. 82, 209 (2010)

work page 2010

[29] [29]

Konečná, F

A. Konečná, F. Iyikanat, and F. J. García de Abajo, Entangling free electrons and optical excitations, Sci. Adv. 8, eabo7853 (2022)

work page 2022

[30] [30]

Y. Y. Tanaka, P. Albella, M. Rahmani, V. Giannini, S. A. Maier, and T. Shimura, Plasmonic linear nanomotor using lateral optical forces, Sci. Adv. 6, eabc3726 (2020). *Contact author: sannomiya.t.aa@m.titech.ac.jp Supplemental Material for Electron Recoil via Sample Momentum Transfer under Optical Excitation Akira Yasuhara1, Yamato Kirii2, Takumi Sannomiy...

work page 2020