Pith. sign in

Paper Citation Record · LEDGER

Electron shuttling as a probe for charge defects

As of 11 August 2026, this Paper Citation Record lists 58 of 58 outbound references and 1 inbound Pith citation observation for arXiv:2607.21718.

A citation records a reference. It does not transfer a finding from one paper to another.

pith.paper-citation-record.v1
2607.21718 v1

Coverage vector

measured 58 of 58 reference resolution

Typed states for the displayed outbound observations.

Source: paper_references, paper_reference_links, observed 2026-08-01T06:58:53.834142Z

measured 59 of 59 standing notices

One-hop event checks from named stored sources.

Source: scholarly_work_events, retraction_status_cache, observed 2026-08-10T06:31:04.303077+00:00

measured 1 of 1 inbound itemization

Pith citing papers itemized under the disclosed page cap.

Source: paper_references, paper_reference_links, observed 2026-08-01T06:58:47.658712Z

measured 0 of 1 external citation measurements

A source-named dated measurement, never combined with another source.

Source: cited_works

Reference resolution

58 of 58 outbound references displayed

  • verified exact2
  • verified fuzzy0
  • unresolved55
  • parse uncertain0
  • malformed identifier1
  • metadata mismatch0

External citation measurements

No source-named external measurement is stored.

Outbound references

Observation 9f1ac27e-15d1-4c8b-9dab-4b668cdf2cc6 · outbound

This paper cites Maurand, X.

Electron shuttling as a probe for charge defects Maurand, X

Reference 1

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:47.785734Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:47.785734Z digest=sha256:0285ca94a91df873f4fcfe640bece50095f9f5efac8af262a2b6fbd0fe0a8846

Observation 4f1aceae-83ce-4419-86dc-93c9e4d75783 · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 2

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:47.961093Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:47.961093Z digest=sha256:c2e90486b7e329957ca564fb185bc7a5edbb0eb35a70f0573e012f3213977a2b

Observation c6edbdd8-d733-4d45-8a1d-01cfea2c8838 · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 3

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:48.131081Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:48.131081Z digest=sha256:06a34c8db7dfbe2cc69c08c6d38219b060e17cc1a2628f8bc60a5168ba0ffa90

Observation 37f8d1c4-c67e-4a7e-a9a3-746a665623f7 · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 4

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:48.261864Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:48.261864Z digest=sha256:9b4c8b2274ded07eec035155a8ee557d296dedf1461ebea94a4c2bd20e1080ce

Observation 845723f6-7391-4dcf-8201-3b3355209452 · outbound

This paper cites Steinacker, N.

Electron shuttling as a probe for charge defects Steinacker, N

Reference 5

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:48.358625Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:48.358625Z digest=sha256:b7f8d07ddf5487518a28e976f88bfee45bab67c2f1af1e36e72b4dccaed04e38

Observation 70e50029-4334-42e4-84ab-1d8a3aa9c384 · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 6

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:48.476366Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:48.476366Z digest=sha256:9b631a0feaa189e89199374a30a044158eb21c5e749b35bea055dc2dd34b4266

Observation 3b162e4a-eaee-4b85-9e6e-6d9e7fc49501 · outbound

This paper cites Burkard, T.

Electron shuttling as a probe for charge defects Burkard, T

Reference 7

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:48.615609Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:48.615609Z digest=sha256:40d6887451d1ad9f912d4ecc93facd28d347c0b458aa9d5ee3bac30a682d084f

Observation cfdc9868-351b-4f87-9003-9f525be461f9 · outbound

This paper cites Simultaneous High-Fidelity Single-Qubit Gates in a Spin Qubit Array.

Electron shuttling as a probe for charge defects Simultaneous High-Fidelity Single-Qubit Gates in a Spin Qubit Array

Reference 8

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:48.735421Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:48.735421Z digest=sha256:ba4c358f1717194e12ece6043d5f9411b0bd005e78e4f97d751ba1952e77fab5

Observation 91eb1155-a028-4e07-9044-afb0270912ec · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 9

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:48.903350Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:48.903350Z digest=sha256:a1945fe9af0fd6b11ac9ac1e30aedb8042ff0e406014cdd865db34be76ec0905

Observation b2a03959-4f4e-441b-8872-f61cc6c16495 · outbound

This paper cites Scappucci, and S.

Electron shuttling as a probe for charge defects Scappucci, and S

Reference 10

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:49.017308Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:49.017308Z digest=sha256:0f34b337fa685e26660ce850ad0e8bc5cac5fd106b9cc0fa308bce2d5bfb56ed

Observation e9c711fc-81b1-4070-a2c9-e28cc8b8d834 · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 11

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:49.134238Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:49.134238Z digest=sha256:3488986b8b5e85a1d07595f6439cc543d2290685ba81651e544a85987ed128fb

Observation 81104738-63c4-4314-bb2d-7addc6474102 · outbound

This paper cites High-fidelity dispersive spin sensing in a tuneable unit cell of silicon MOS quantum dots.

Electron shuttling as a probe for charge defects High-fidelity dispersive spin sensing in a tuneable unit cell of silicon MOS quantum dots

Reference 12

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:49.209576Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:49.209576Z digest=sha256:81d431b2fe8743ce73df3cec84fda97a8725f440538785c235b79868652808e8

Observation 34419c90-ac67-4060-952b-354a46ec49d2 · outbound

This paper cites Takeda, A.

Electron shuttling as a probe for charge defects Takeda, A

Reference 13

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:49.340467Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:49.340467Z digest=sha256:b90e7608e0ff7c82b8e8f25151310b5b776b82eed014ba0bca7b85a1b0195a29

Observation 41fe37f3-fcd7-4b94-8571-e42c4d41c92e · outbound

This paper cites Yoneda, W.

Electron shuttling as a probe for charge defects Yoneda, W

Reference 14

Resolution
verified exact
doi, observed 2026-08-01T07:08:39.451060Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

source=pdf_text observed=2026-08-01T06:58:49.460636Z digest=sha256:cdcdece14edd5b7728116dccfe6f609fa6136229c16bb436342d125fce18d5ff

Observation 035e8e21-2805-457d-ab53-bb730a8ac96a · outbound

This paper cites Seidler, T.

Electron shuttling as a probe for charge defects Seidler, T

Reference 15

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:49.523737Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:49.523737Z digest=sha256:3387e2417d42c15c9a23e72f0f983ee3b1c20762d2a873c478a88b68cb73d22b

Observation a3b24305-70ef-4477-97bb-851b5a86e3f7 · outbound

This paper cites High-fidelity single-spin shuttling in silicon.

Electron shuttling as a probe for charge defects High-fidelity single-spin shuttling in silicon

Reference 16

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:49.600490Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:49.600490Z digest=sha256:43ece6672ff1a94255241e854b53ae6e6c87314c5e5e443934752f9678471ca4

Observation 88e3b52a-de8b-47be-825c-b3cd14ec856e · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 17

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:49.663867Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:49.663867Z digest=sha256:64cc1772af65923bf6f51b1b2346ee441cce48239bc3031c505c15e5537cdce8

Observation 54fcc90d-3b13-49c2-a724-c93761c462a9 · outbound

This paper cites Siegel, A.

Electron shuttling as a probe for charge defects Siegel, A

Reference 18

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:49.819497Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:49.819497Z digest=sha256:59ed7d0956b5a1bd04375fa0e5fbbfcebef0d65de3f999cf10eb8810c674df8f

Observation 191efc08-8e03-425a-b62b-a8842f6891a3 · outbound

This paper cites Siegel, Z.

Electron shuttling as a probe for charge defects Siegel, Z

Reference 19

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:49.920680Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:49.920680Z digest=sha256:91d3cb7b0bf602c84adc3ae43ba620482490c0e311c07aacab430be0cfffe775

Observation c8922f91-17d7-43c3-a2fb-334b3371f1a4 · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 20

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:50.006494Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:50.006494Z digest=sha256:43ffcf749cac8e26715cb1703b6c04ede9500571d0f736735d24b48553047074

Observation 2b50956e-e216-4833-b120-80f12cd36c5b · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 21

Resolution
verified exact
doi, observed 2026-08-01T07:08:39.123358Z

Source-reported events for the cited work

No event found in the named queried sources as of 2026-08-10T06:31:04.303077+00:00.

source=pdf_text observed=2026-08-01T06:58:50.124250Z digest=sha256:ca95b9ad5372f2b79e7ec88b95648d7b729f5a5e920b683a7384ba2b6960dc7b

Observation fedf9fbb-81e4-440f-b0e6-6afbab89e574 · outbound

This paper cites Jnane, A.

Electron shuttling as a probe for charge defects Jnane, A

Reference 22

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:50.247593Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:50.247593Z digest=sha256:c13c28f71bc8dafe8c76f103e536da592d0d552e39880fa0d07ccf7b3f5a878b

Observation e94537e2-ebd0-49de-bb53-40d3ef8e925a · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 23

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:50.396350Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:50.396350Z digest=sha256:269cda900bc0973c46873a1607109741dd894ba2be1e0fffb5ea3ffb2e9b4dc7

Observation 85185d01-496a-46c9-8ae2-06e93c283b95 · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 24

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:50.522841Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:50.522841Z digest=sha256:8c50948b522f5421977b0fbbfd4c20c60fa4f6517443f5fbad69b3753324dcd1

Observation 0b95bfca-ff45-43e4-93e3-a81ddf3bdc86 · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 25

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:50.689748Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:50.689748Z digest=sha256:80896d7c6597bb4339886be7971c9fc44db22bd810bac963e60488b004d9c8e1

Observation 2a832e40-2fcf-4b5c-9019-97d1e7ccc36c · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 26

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:50.832094Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:50.832094Z digest=sha256:bed7dd323c2983ae740cee5d59578811985b48272fcda31b4340c82663852bb8

Observation e5401235-0d99-4c41-b53f-15f8164afb1a · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 27

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:50.935373Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:50.935373Z digest=sha256:d93ca5fb92d7027a0912815142691380e6619fd9308073bc470aecc03518013c

Observation 5ba8eff7-85c4-4c53-9a04-1174acf77497 · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 28

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:50.990546Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:50.990546Z digest=sha256:2876d752db7e9e4faf98717dbf6bf5701b7a41219c845d9e18334d25c77cdc60

Observation d7c1a7d1-0adc-4ea6-8fb8-c45a64c6b190 · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 29

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:51.070707Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:51.070707Z digest=sha256:908a4a1633ef2fef6a04573b648fb83c07797bb88cf085da5b8f235e12a21321

Observation c2c52f1c-273d-4b09-b27f-b9aec15403f8 · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 30

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:51.136820Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:51.136820Z digest=sha256:9ff5ddc459f5ef9cb80e8fcf991331436e0d224ba8f7ece45c7b31ba20678cfe

Observation f4f1eafe-2dba-4e95-9781-bd866430256a · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 31

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:51.225862Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:51.225862Z digest=sha256:85c9e23968d7e03a78e56e412f02e9522448593f4da65cf9db304a610f0472a8

Observation f67d8c61-47bf-453a-9eb7-8977621bf395 · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 32

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:51.285314Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:51.285314Z digest=sha256:a7fc70c4153301293c5dc60454319f97879904c6cb632f5fa050ab31b7392182

Observation 2af09581-be4d-493c-86a6-6438c59d2b0e · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 33

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:51.353310Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:51.353310Z digest=sha256:fec8503c221010a345b74fc3c34c5e5f3594464262e41b22b9c40b5ec0ac33e1

Observation c089d0f5-9f1f-4519-96ec-aba1cbfa7a2e · outbound

This paper cites Jeon and Z.

Electron shuttling as a probe for charge defects Jeon and Z

Reference 34

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:51.420943Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:51.420943Z digest=sha256:ddbf1ad8bcd280cf2dab766122328ca025a9657397b03885cd022bddc139f84b

Observation afd53d21-bf1b-4f43-8f37-0e11ba5737bd · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 35

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:51.467446Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:51.467446Z digest=sha256:6302144f4aba4a1c25b7b6767a7c9e79bd718a0d5ff11400c7c0bf5915f07fcc

Observation d6da3215-c072-4b77-ae05-087e77c2122f · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 36

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:51.577988Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:51.577988Z digest=sha256:42043af55965990718941ac0ac0d3445219b05b5308334f72ed3a89706962abe

Observation 4c326ef7-ed69-40fa-8fba-bf15ecb6b804 · outbound

This paper cites Vigneau, F.

Electron shuttling as a probe for charge defects Vigneau, F

Reference 37

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:51.705279Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:51.705279Z digest=sha256:22c82ae1095cbd5b7cb673b0e82345189b8b5594c4d21a3f4a997d5300cbbffd

Observation de5a3202-17ed-45d6-81a0-361af6dc31b2 · outbound

This paper cites Mehmandoost and V.

Electron shuttling as a probe for charge defects Mehmandoost and V

Reference 38

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:51.904749Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:51.904749Z digest=sha256:58070b3936b7f44b0b000e84816b37eb34afe0c22a7fb19094ebb0f24fe6fcf6

Observation 2017d76e-80bc-4722-a504-6bd02a42d051 · outbound

This paper cites Nishi, K.

Electron shuttling as a probe for charge defects Nishi, K

Reference 39

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:52.075731Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:52.075731Z digest=sha256:47f569f1bdcf27f6a92f2ee02d055483430d0247adfaedbcf9f8140e2c22c8bd

Observation c0bbaa60-b5be-4c58-bb40-d01870f35ead · outbound

This paper cites However, the defects we are interested in sit at a buried interface or in the bulk.

Electron shuttling as a probe for charge defects However, the defects we are interested in sit at a buried interface or in the bulk

Reference 40

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:47.522569Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:47.522569Z digest=sha256:7497f95ef1dd1ad0f50aa6f124430347bc6aac9f636d0526b1da73d0aaed76d8

Observation 6cfab21e-1ebe-4e5d-9bc1-6ab070b026b0 · outbound

This paper cites Cakar, H.

Electron shuttling as a probe for charge defects Cakar, H

Reference 41

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:52.221529Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:52.221529Z digest=sha256:8ee2bbf8aca2e1e134174ac3c8f6bab988486b06114a7c8a166895007632f6bc

Observation baa801bc-d08f-43b1-8c44-5e9bf35104cd · outbound

This paper cites Electron shuttling as a probe for charge defects.

Electron shuttling as a probe for charge defects Electron shuttling as a probe for charge defects

Reference 42

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:47.658712Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:47.658712Z digest=sha256:db2d7fc6bd7d3c5377c8b8b04386094e9c67e19fd9032da463f3ee14ce0b7e16

Observation f648db10-cfcd-46d0-b968-16a2cd398595 · outbound

This paper cites Pitters, J.

Electron shuttling as a probe for charge defects Pitters, J

Reference 43

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:52.144648Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:52.144648Z digest=sha256:59e40feb468c8f18ee7a41c40e55913edb95193daccff0a4d335a397017c7e17

Observation 3f6577fb-b1bb-4cb5-8af0-b14aa895b516 · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 44

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:52.299423Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:52.299423Z digest=sha256:0d0363960252fb43772b24c7d0c71e619a854f2ba05ef57ec6dee73f59a427ef

Observation b963808b-26b3-4b61-ac71-232b55d70507 · outbound

This paper cites Volmer, T.

Electron shuttling as a probe for charge defects Volmer, T

Reference 45

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:52.386581Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:52.386581Z digest=sha256:fcdd8d36e3c038b0659888da5139b415c491b03b884a4c497cce87c622eb78f0

Observation 70d35965-68e1-49a5-83eb-2dfbf5ebbc50 · outbound

This paper cites Mapping g-factors and complex intervalley coupling in Si/SiGe by conveyor-mode shuttling.

Electron shuttling as a probe for charge defects Mapping g-factors and complex intervalley coupling in Si/SiGe by conveyor-mode shuttling

Reference 46

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:52.470131Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:52.470131Z digest=sha256:e64df9e8d8d9963c4b557fdbe01b90ac6ef55e0764fa8adf984218d79661cb69

Observation 680d8dc2-51c8-45d1-b9e1-219c60a09fff · outbound

This paper cites Modeling of decoherence and fidelity enhancement during transport of entangled qubits.

Electron shuttling as a probe for charge defects Modeling of decoherence and fidelity enhancement during transport of entangled qubits

Reference 47

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:52.539556Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:52.539556Z digest=sha256:c3021c9fbf816c75bd900ed4494d6344ec9d005b1c82e577ddb98181bc50ddb2

Observation d769c55b-1621-444a-8063-24a483ea8235 · outbound

This paper cites Bergli, Y.

Electron shuttling as a probe for charge defects Bergli, Y

Reference 48

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:52.600680Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:52.600680Z digest=sha256:bd6139af9949ad0e76f53a1a7e0c7d320c4ada9f8ef3304290d50fe61e284e50

Observation c573e275-1e87-4074-a78f-9766e9090e3b · outbound

This paper cites Modelling the Impact of Device Imperfections on Electron Shuttling in SiMOS devices.

Electron shuttling as a probe for charge defects Modelling the Impact of Device Imperfections on Electron Shuttling in SiMOS devices

Reference 49

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:52.673145Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:52.673145Z digest=sha256:87726fececebbae0b8e611fa1834f2e2381e4d30febe980ad2694de43db96bc5

Observation ecf61588-44e4-49fd-9d0b-2a000d62ce34 · outbound

This paper cites Ruskov, M.

Electron shuttling as a probe for charge defects Ruskov, M

Reference 50

Resolution
malformed identifier
no resolver link, observed 2026-08-01T06:58:52.786274Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:52.786274Z digest=sha256:fdc5f8d1f61affc76d9fcf91de2e921b42cee593cd5eb4c232cd887bcde6ec7f

Observation 5328fa4b-d278-4e71-ae81-15328fc592e1 · outbound

This paper cites Ferdous, K.

Electron shuttling as a probe for charge defects Ferdous, K

Reference 51

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:52.868635Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:52.868635Z digest=sha256:f70710cfd060cb7c80e9aa6e2014c93ecc0421a75dc7a19d22483c086ce86183

Observation a2f888a1-1edb-455a-8853-8f91c20840d5 · outbound

This paper cites Dexter, B.

Electron shuttling as a probe for charge defects Dexter, B

Reference 52

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:52.988296Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:52.988296Z digest=sha256:04d1b97f3a11b8cbaae0a6ed4909006e5d6e98d3c0e16f7f45d3491e5e6dcb08

Observation e3b52dde-cc16-4e8d-8b48-9240c1fc26d0 · outbound

This paper cites Ghahramani and M.

Electron shuttling as a probe for charge defects Ghahramani and M

Reference 53

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:53.082917Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:53.082917Z digest=sha256:41663063085e55ce047d229c2b5b2c35c5b1126589a878aaf9c18a948381dc51

Observation 5eb21998-72cd-416a-ab49-10baaadc3640 · outbound

This paper cites an unresolved cited work.

Electron shuttling as a probe for charge defects Unresolved cited work

Reference 54

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:53.142067Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:53.142067Z digest=sha256:ba4446a23f2e4b9af7808de6c8dfa8f39fd1db3ea8f9d700dce84d96adfbc3fa

Observation 8597dd21-59f6-42cb-b9cc-644e9bf144a7 · outbound

This paper cites Electron shuttling as a probe for charge defects.

Electron shuttling as a probe for charge defects Electron shuttling as a probe for charge defects

Reference 55

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:53.281692Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:53.281692Z digest=sha256:081c961e40d843641856bf04ce4251f5c85ff99f5ba65b67338f088a96a533c5

Observation b088c159-e35b-4c7a-b462-ee9ba8b55bf3 · outbound

This paper cites Suppose that we start with the TLF inr+ d at timetand consider what could happen during the interval[t, t+dt].

Electron shuttling as a probe for charge defects Suppose that we start with the TLF inr+ d at timetand consider what could happen during the interval[t, t+dt]

Reference 56

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:53.486552Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:53.486552Z digest=sha256:8bef926064dc774c19236e42b5ef4e1666e91392778b17f66477d8e40350fe57

Observation 067c5a18-d989-4d65-be16-b355ccce400c · outbound

This paper cites The factor2comes from the fact that the two integrals are equal.

Electron shuttling as a probe for charge defects The factor2comes from the fact that the two integrals are equal

Reference 57

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:53.636465Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:53.636465Z digest=sha256:36ced303a3a7fcea314fb7d3799e22b88ae6b1872950c9ffb5c8431728008c08

Observation 0663426c-6d64-4a9d-96fb-c44d57020f27 · outbound

This paper cites AsγT≫1, we can see thatu 2 will decay extremely fast, we can thus assume thatdu2 dt = 0.

Electron shuttling as a probe for charge defects AsγT≫1, we can see thatu 2 will decay extremely fast, we can thus assume thatdu2 dt = 0

Reference 58

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:53.834142Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:53.834142Z digest=sha256:2a814b73627c90f81f5e439012a88751985640911f3349ccfac085b185b9cf3a

Pith citing papers

Observation baa801bc-d08f-43b1-8c44-5e9bf35104cd · inbound

Electron shuttling as a probe for charge defects cites this paper.

Electron shuttling as a probe for charge defects Electron shuttling as a probe for charge defects

Reference 42

Resolution
unresolved
no resolver link, observed 2026-08-01T06:58:47.658712Z

Source-reported events for the cited work

Unavailable: canonical work link unavailable.

source=pdf_text observed=2026-08-01T06:58:47.658712Z digest=sha256:db2d7fc6bd7d3c5377c8b8b04386094e9c67e19fd9032da463f3ee14ce0b7e16