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Review: Deep Learning in Electron Microscopy

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arxiv 2009.08328 v7 pith:5VHZGEYV submitted 2020-09-17 eess.IV cond-mat.mtrl-scics.CVcs.LG

classification eess.IVcond-mat.mtrl-scics.CVcs.LG
keywords deepelectronlearningmicroscopyreviewdiscusspopularafterwards
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Deep learning is transforming most areas of science and technology, including electron microscopy. This review paper offers a practical perspective aimed at developers with limited familiarity. For context, we review popular applications of deep learning in electron microscopy. Afterwards, we discuss hardware and software needed to get started with deep learning and interface with electron microscopes. We then review neural network components, popular architectures, and their optimization. Finally, we discuss future directions of deep learning in electron microscopy.

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Cited by 1 Pith paper

Reviewed papers in the Pith corpus that reference this work. Sorted by Pith novelty score. OpenAlex reports about 2 citations worldwide. Full citation record

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    AI for nanoparticle TEM/STEM has progressed from detection and segmentation to physics-informed restoration, 2D-to-3D inference, and spatiotemporal analysis of in situ dynamics, with remaining gaps in benchmarking and...

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