pBTI stress broadens IGZO band tail states causing negative VT shifts, revealed by DC and 1/f noise data with reversibility confirmed by recovery and hydrogen-doping simulations.
Light-Assisted Investigation of the Role of Oxygen Flow during IGZO Deposition on Deep Subgap States and their Evolution Under PBTI
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Review summarizing innovations in phase-change memory energy efficiency via material scaling and thermal confinement, with discussion of attojoule-scale theoretical limits constrained by parasitics.
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Band Tail State Broadening in IGZO TFTs After pBTI-Induced Negative VT Shift Revealed via DC and 1/f Noise Measurements
pBTI stress broadens IGZO band tail states causing negative VT shifts, revealed by DC and 1/f noise data with reversibility confirmed by recovery and hydrogen-doping simulations.
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Energy and Scaling Limits of Phase-Change Memory
Review summarizing innovations in phase-change memory energy efficiency via material scaling and thermal confinement, with discussion of attojoule-scale theoretical limits constrained by parasitics.