In situ SEM-DIC and EBSD measurements on cold-worked AA-5052 show crack arrest coincides with divergence of elastic and elastoplastic energy release rates as the crack-tip process zone expands beyond grain size.
Grain detection from 2d and 3d EBSD data — Specification of the MTEX algorithm
3 Pith papers cite this work. Polarity classification is still indexing.
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Interlaboratory study on EBSD data leads to proposed recommendations for standardizing average grain size measurement in AM microstructures.
TrueEBSD has been integrated into MTEX as an add-on for image matching and spatial distortion correction to support correlative EBSD and SEM microscopy.
citing papers explorer
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In situ elucidation of mechanisms governing crack transition to plasticity arrest
In situ SEM-DIC and EBSD measurements on cold-worked AA-5052 show crack arrest coincides with divergence of elastic and elastoplastic energy release rates as the crack-tip process zone expands beyond grain size.
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TrueEBSD in MTEX: automatic image matching for correlative microscopy applications
TrueEBSD has been integrated into MTEX as an add-on for image matching and spatial distortion correction to support correlative EBSD and SEM microscopy.