In situ SEM-DIC and EBSD measurements on cold-worked AA-5052 show crack arrest coincides with divergence of elastic and elastoplastic energy release rates as the crack-tip process zone expands beyond grain size.
Grain detection from 2d and 3d EBSD data — Specification of the MTEX algorithm
3 Pith papers cite this work. Polarity classification is still indexing.
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Interlaboratory study on EBSD data leads to proposed recommendations for standardizing average grain size measurement in AM microstructures.
TrueEBSD has been integrated into MTEX as an add-on for image matching and spatial distortion correction to support correlative EBSD and SEM microscopy.
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Towards standardisation of average grain size measurement of additively manufactured microstructures using EBSD
Interlaboratory study on EBSD data leads to proposed recommendations for standardizing average grain size measurement in AM microstructures.