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arxiv: 2606.06421 · v1 · pith:4IRTZIZ4new · submitted 2026-06-04 · 💻 cs.AR

Modeling, Optimizing and Exploring Multi-Die FPGA Routing Architectures

Pith reviewed 2026-06-27 23:05 UTC · model grok-4.3

classification 💻 cs.AR
keywords FPGA3D integrationdie stackingrouting architecturemulti-dieinterposerVTRcritical path delay
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The pith

With suitable inter-die routing, 3D FPGAs cut wirelength up to 14% and critical path delay 6% versus 2D while staying routable.

A machine-rendered reading of the paper's core claim, the machinery that carries it, and where it could break.

The paper builds modeling and optimization extensions inside the VTR framework to handle routing across stacked FPGA dice. It uses circuit simulation to capture how inter-die links behave under different stacking technologies and connection densities. The results demonstrate that both 2.5D and 3D organizations can enlarge device capacity while keeping wirelength, delay, and routability close to single-die baselines. The work supplies concrete numbers on overheads and shows the architectures remain viable with existing die-crossing pitches.

Core claim

With suitable inter-die routing architectures, 2.5D and 3D FPGAs increase capacity without significant routability or delay penalties. Specifically, 3D FPGAs achieve up to 14% wirelength reduction and 6% CPD improvement over 2D devices and remain routable even with existing 10μm pitch technologies, while 2.5D FPGAs incur only a 2% wirelength and 4% CPD overhead at 32% inter-die connectivity.

What carries the argument

An extended VTR/VPR CAD flow augmented with HSPICE models of inter-die connections across 7 nm active dice and 45 nm interposers, plus modified placement and routing algorithms that optimize for multi-die topologies.

If this is right

  • 3D FPGAs can deliver up to 14% shorter total wirelength and 6% better critical path delay than equivalent 2D devices.
  • Multi-die FPGAs stay routable down to current 10 μm inter-die pitches when the routing architecture is chosen appropriately.
  • 2.5D designs incur only 2% wirelength and 4% CPD penalty at 32% inter-die connectivity levels.
  • Capacity scaling through die stacking is possible without forcing large increases in area or routing resources.

Where Pith is reading between the lines

These are editorial extensions of the paper, not claims the author makes directly.

  • The same modeling approach could be applied to evaluate 3D stacking in other reconfigurable fabrics or even ASICs.
  • Future process nodes with denser inter-die links would likely widen the performance advantage shown for 3D organizations.
  • Open-sourcing the extensions allows direct comparison of multi-die FPGA designs against emerging monolithic 3D alternatives.

Load-bearing premise

The HSPICE circuit models of inter-die connections for a 7 nm process and 45 nm silicon interposer accurately predict the latency, density, and electrical behavior that will appear in real fabricated devices.

What would settle it

Build and measure a physical 3D FPGA prototype using one of the modeled inter-die routing schemes and compare its measured wirelength and critical path delay directly against the tool predictions.

Figures

Figures reproduced from arXiv: 2606.06421 by Amirhossein Poolad, Andrew Boutros, Soheil Gholami Shahrouz, Vaughn Betz.

Figure 1
Figure 1. Figure 1: Example of 2.5D and 3D integration in FPGAs. [PITH_FULL_IMAGE:figures/full_fig_p001_1.png] view at source ↗
Figure 2
Figure 2. Figure 2: Distributed RC delay of interposer wires vs. their [PITH_FULL_IMAGE:figures/full_fig_p003_2.png] view at source ↗
Figure 3
Figure 3. Figure 3: 2.5D (blue) and 3D (red) inter-die connection circuit [PITH_FULL_IMAGE:figures/full_fig_p004_3.png] view at source ↗
Figure 4
Figure 4. Figure 4: Total interconnect delay vs. wirelength for varying fan [PITH_FULL_IMAGE:figures/full_fig_p004_4.png] view at source ↗
Figure 5
Figure 5. Figure 5: SG XML syntax for 3D stacked FPGAs. with num_conns setting the fan-in Fg and side restricting which switch-block sides contribute. The <sg_link> tag speci￾fies the multiplexer type, the inter-die wire segment, and the spatial displacement to the destination switch block via spatial offsets. The <scatter> tag mirrors the gather, distributing the signal to Fsc wires at the destination switch block [PITH_FUL… view at source ↗
Figure 6
Figure 6. Figure 6: (a) Default router lookahead for a 2D architecture. (b) [PITH_FULL_IMAGE:figures/full_fig_p006_6.png] view at source ↗
Figure 7
Figure 7. Figure 7: Area-delay products of the explored multi-die archi [PITH_FULL_IMAGE:figures/full_fig_p008_7.png] view at source ↗
read the original abstract

Die stacking has enabled 2.5D FPGAs by integrating multiple active dice on a passive silicon interposer for improved yield and capacity, and paved the way for 3D architectures that stack active dice directly atop one another. In these multi-die devices, the unique electrical and physical characteristics of the underlying die-stacking technology impose limitations on inter-die connection density and latency, necessitating a bespoke inter-die routing architecture. However, the absence of accurate and versatile modeling tools has left most questions about how to best design the inter-die routing architecture unanswered. To address this gap, we enhance the open-source FPGA CAD tool VTR to flexibly model a wide range of multi-die routing architectures, and augment VPR's placement and routing engines to improve optimization for both 2.5D and 3D FPGAs. We perform HSPICE-based circuit modeling of inter-die connections for active dice using a 7 nm process node and a 45 nm silicon interposer across several die-crossing technologies. Using this enhanced framework, we conduct a detailed design space exploration of inter-die routing architecture in 2.5D and 3D FPGAs, characterizing the impact of die-crossing technology, inter-die connection count, fan-in/fan-out, and interposer wire length on critical path delay (CPD), wirelength, area, and routability. Our results show that with suitable inter-die routing architectures, 2.5D and 3D FPGAs can increase capacity without significant routability or delay penalties. Specifically, 3D FPGAs achieve up to 14% wirelength reduction and 6% CPD improvement over 2D devices, and remain routable even with existing $10\,\mu$m pitch technologies, while 2.5D FPGAs incur only a 2% wirelength and 4% CPD overhead at 32% inter-die connectivity. All extensions are open source and integrated with the VTR master branch.

Editorial analysis

A structured set of objections, weighed in public.

Desk editor's note, referee report, simulated authors' rebuttal, and a circularity audit. Tearing a paper down is the easy half of reading it; the pith above is the substance, this is the friction.

Referee Report

2 major / 1 minor

Summary. The paper enhances the open-source VTR framework (including VPR placement/routing) to model and optimize inter-die routing architectures for 2.5D (silicon interposer) and 3D FPGAs. It performs HSPICE circuit modeling of inter-die connections using a 7 nm process node for active dice and 45 nm interposer across multiple die-crossing technologies, then uses the augmented CAD flow to explore the impact of connection density, fan-in/fan-out, and wire length on CPD, wirelength, area, and routability. The central claim is that suitable inter-die architectures allow capacity scaling with limited penalties: 3D FPGAs achieve up to 14% wirelength reduction and 6% CPD improvement versus 2D while remaining routable at 10 μm pitch; 2.5D FPGAs incur only 2% wirelength and 4% CPD overhead at 32% inter-die connectivity. All extensions are released open-source and merged into the VTR master branch.

Significance. If the HSPICE-derived electrical parameters prove representative of fabricated stacks, the work is significant as the first open-source, flexible CAD framework for systematic design-space exploration of multi-die FPGA routing. The explicit release and VTR integration, combined with the parameter sweeps over connection count and fan-in/fan-out, supply reproducible data and tooling that the community can use to evaluate 2.5D/3D trade-offs. This directly addresses the modeling gap noted in the abstract and supplies concrete quantitative guidance on routability at existing pitches.

major comments (2)
  1. [HSPICE modeling (Abstract + methods)] HSPICE modeling paragraph (Abstract) and associated methods: The manuscript describes the HSPICE setup for 7 nm dice + 45 nm interposer but reports no calibration against published TSV/micro-bump silicon measurements, no process-corner validation, and no sensitivity sweeps (e.g., ±20 % inter-die capacitance). Because every headline percentage (14 % WL reduction, 6 % CPD gain, 2 %/4 % 2.5D overhead, routability at 10 μm pitch) is produced by feeding the resulting RC/delay values into the modified VPR, the absence of validation is load-bearing for the central claim that “suitable inter-die routing architectures” incur “no significant routability or delay penalties.”
  2. [Results on 3D FPGAs] Results on 3D routability at 10 μm pitch: The statement that 3D devices “remain routable even with existing 10 μm pitch technologies” rests entirely on the unvalidated HSPICE delay model. A concrete sensitivity test showing how the reported routability margin changes under plausible model error would be required to support the claim.
minor comments (1)
  1. [Abstract] Abstract: the phrase “several die-crossing technologies” is used without enumerating them; an explicit list would improve readability.

Simulated Author's Rebuttal

2 responses · 0 unresolved

We thank the referee for the detailed and constructive review. The comments on HSPICE modeling validation are well-taken and highlight an area where the manuscript can be strengthened. We address each major comment below.

read point-by-point responses
  1. Referee: [HSPICE modeling (Abstract + methods)] HSPICE modeling paragraph (Abstract) and associated methods: The manuscript describes the HSPICE setup for 7 nm dice + 45 nm interposer but reports no calibration against published TSV/micro-bump silicon measurements, no process-corner validation, and no sensitivity sweeps (e.g., ±20 % inter-die capacitance). Because every headline percentage (14 % WL reduction, 6 % CPD gain, 2 %/4 % 2.5D overhead, routability at 10 μm pitch) is produced by feeding the resulting RC/delay values into the modified VPR, the absence of validation is load-bearing for the central claim that “suitable inter-die routing architectures” incur “no significant routability or delay penalties.”

    Authors: We acknowledge that the manuscript does not include direct calibration of the HSPICE models against published silicon measurements for TSVs or micro-bumps, nor process-corner validation or sensitivity sweeps. The models rely on standard foundry PDKs for the specified nodes. In the revised manuscript we will add a dedicated sensitivity analysis section that varies inter-die capacitance and resistance by ±20 % (and other key RC parameters) and reports the resulting changes to CPD, wirelength, and routability margins. This will quantify the robustness of the headline claims under plausible model error while remaining within the scope of a CAD modeling study. revision: yes

  2. Referee: [Results on 3D FPGAs] Results on 3D routability at 10 μm pitch: The statement that 3D devices “remain routable even with existing 10 μm pitch technologies” rests entirely on the unvalidated HSPICE delay model. A concrete sensitivity test showing how the reported routability margin changes under plausible model error would be required to support the claim.

    Authors: We agree that the routability claim at 10 μm pitch would be more robust with an explicit sensitivity test. The sensitivity analysis described in our response to the first comment will directly address this by showing how the routability margin at 10 μm pitch varies under the same ±20 % parameter perturbations. The revised manuscript will include these results to support the statement that suitable architectures remain routable with existing pitches. revision: yes

Circularity Check

0 steps flagged

No circularity: results from independent HSPICE modeling fed into extended open-source VPR/VTR

full rationale

The paper performs HSPICE circuit modeling of inter-die connections using a 7 nm process and 45 nm interposer, then augments the existing VTR/VPR placement and routing engines to explore architecture parameters. All quantitative results (wirelength, CPD, routability) are produced by running the modified tool on standard benchmarks with the externally-simulated RC/delay values as inputs. No equations in the manuscript define a quantity in terms of itself, no fitted parameter is relabeled as a prediction, and no load-bearing claim reduces to a self-citation chain. The derivation chain is therefore self-contained against external simulation and benchmark data.

Axiom & Free-Parameter Ledger

0 free parameters · 1 axioms · 0 invented entities

The central claims rest on the accuracy of the HSPICE inter-die models and on the assumption that VPR placement/routing enhancements correctly optimize for the new multi-die constraints; no free parameters are fitted to target results in the abstract.

axioms (1)
  • domain assumption HSPICE circuit models for 7 nm active dice and 45 nm interposer accurately represent real inter-die electrical behavior and latency
    Invoked to generate the performance numbers reported for different die-crossing technologies.

pith-pipeline@v0.9.1-grok · 5911 in / 1334 out tokens · 24090 ms · 2026-06-27T23:05:53.345678+00:00 · methodology

discussion (0)

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