Benchmarks for Industrial Inspection Based on Structured Light
Reviewed by Pithpith:KHTIXNXNopen to challenge →
classification
cs.CV
eess.IV
keywords
inspectionlightstructuredmetricbenchmarksdeviceevaluationindustrial
read the original abstract
Robustness and accuracy are two critical metrics for industrial inspection. In this paper, we propose benchmarks that can evaluate the structured light method's performance. Our evaluation metric was learning from a lot of inspection tasks from the factories. The metric we proposed consists of four detailed criteria such as flatness, length, height and sphericity. Then we can judge whether the structured light method/device can be applied to a specified inspection task by our evaluation metric quickly. A structured light device built for TypeC pin needles inspection performance is evaluated via our metrics in the final experimental section.
This paper has not been read by Pith yet.
discussion (0)
Sign in with ORCID, Apple, or X to comment. Anyone can read and Pith papers without signing in.