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V. A. Yuryev

Identifiers

  • name variant V. A. Yuryev 0.60 · backfill

Papers (35)

  1. Crystallites in Color Glass Beads of the 19th Century and Their Influence on Fatal Deterioration of Glass cond-mat.mtrl-sci · 2017 · author #4
  2. KSbOSiO$_4$ microcrystallites as a source of corrosion of blue-green lead-potassium glass beads of the 19th century cond-mat.mtrl-sci · 2016 · author #6
  3. Room-temperature formation of Pt$_3$Si/Pt$_2$Si films on poly-Si substrates cond-mat.mtrl-sci · 2016 · author #4
  4. Ge clusters and wetting layers forming from granular films on the Si(001) surface cond-mat.mtrl-sci · 2015 · author #3
  5. Pt silicide/poly-Si Schottky diodes as temperature sensors for bolometers cond-mat.mtrl-sci · 2015 · author #1
  6. Application of Scanning Mid-IR-Laser Microscopy for Characterization of Semiconductor Materials for Photovoltaics cond-mat.mtrl-sci · 2013 · author #3
  7. Investigation of quantum-dimensional structure parameters by X-ray optical, scanning tunneling and transmission electron microscopy cond-mat.mtrl-sci · 2013 · author #10
  8. Metal silicide/poly-Si Schottky diodes for uncooled microbolometers cond-mat.mtrl-sci · 2013 · author #6
  9. Calculation of thermal parameters of SiGe microbolometers cond-mat.mtrl-sci · 2012 · author #3
  10. Ge/Si(001) heterostructures with dense arrays of Ge quantum dots: morphology, defects, photo-emf spectra and terahertz conductivity cond-mat.mtrl-sci · 2012 · author #1
  11. STM investigation of structural properties of Si layers deposited on Si(001) vicinal surfaces cond-mat.mtrl-sci · 2012 · author #5
  12. Ge/Si(001) Heterostructures with Quantum Dots: Formation, Defects, Photo-Electromotive Force and Terahertz Conductivity cond-mat.mtrl-sci · 2012 · author #1
  13. Application of hydrogenation to low-temperature cleaning of the Si(001) surface in the processes of molecular-beam epitaxy: Investigation by STM, RHEED and HRTEM cond-mat.mtrl-sci · 2012 · author #6
  14. Application of elastic mid-IR-laser-light scattering for non-destructive inspection in microelectronics cond-mat.mtrl-sci · 2011 · author #2
  15. Large-scale defect accumulations in Czochralski-grown silicon cond-mat.mtrl-sci · 2011 · author #3
  16. Application of elastic mid-IR light scattering for inspection of internal gettering operations cond-mat.mtrl-sci · 2011 · author #4
  17. Optical beam-induced scattering mode of mid-IR laser microscopy: a method for defect investigation in near-surface and near-interface regions of bulk semiconductors cond-mat.mtrl-sci · 2011 · author #3
  18. Influence of photoexcitation depth on luminescence spectra of bulk GaAs single crystals: application to defect structure characterization cond-mat.mtrl-sci · 2011 · author #1
  19. Mid-IR-laser microscopy as a tool for defect investigation in bulk semiconductors cond-mat.mtrl-sci · 2011 · author #3
  20. Nucleation of Ge clusters at high temperatures on Ge/Si(001) wetting layer cond-mat.mtrl-sci · 2011 · author #1
  21. Absorption of Terahertz Radiation in Ge/Si(001) Heterostructures with Quantum Dots cond-mat.mes-hall · 2011 · author #3
  22. The Role of Interdiffusion and Spatial Confinement in the Formation of Resonant Raman Spectra of Ge/Si(100) Heterostructures with Quantum-Dot Arrays cond-mat.mtrl-sci · 2010 · author #7
  23. Cathodoluminescence and Selective Emission of Er3+ in Oxides cond-mat.mtrl-sci · 2010 · author #3
  24. Phase transition on the Si(001) clean surface prepared in UHV MBE chamber: A study by high resolution STM and in situ RHEED cond-mat.mtrl-sci · 2010 · author #2
  25. CMOS compatible dense arrays of Ge quantum dots on the Si(001) surface: Hut cluster nucleation, atomic structure, and array life cycle during UHV MBE growth cond-mat.mtrl-sci · 2010 · author #2
  26. On the nature of large-scale defect accumulations in Czochralski-grown silicon cond-mat.mtrl-sci · 2010 · author #3
  27. Possibilities of application of elastic mid-IR light scattering for inspection of internal gettering operations cond-mat.mtrl-sci · 2010 · author #5
  28. Scanning mid-IR-laser microscopy: an efficient tool for materials studies in silicon-based photonics and photovoltaics cond-mat.mtrl-sci · 2010 · author #3
  29. Application of scanning mid-IR-laser microscopy for characterization of semiconductor materials for photovoltaics cond-mat.mtrl-sci · 2010 · author #3
  30. Elastic Mid-Infrared Light Scattering: a Basis for Microscopy of Large-Scale Electrically Active Defects in Semiconducting Materials cond-mat.mtrl-sci · 2010 · author #2
  31. Phase transition between (2 x 1) and c(8 x 8) reconstructions observed on the Si(001) surface around 600C cond-mat.mtrl-sci · 2010 · author #2
  32. Effect of interdiffusion and quantum confinement on Raman spectra of the Ge/Si(100) heterostructures with quantum dots cond-mat.mes-hall · 2009 · author #7
  33. Structure and peculiarities of the (8 x n)-type Si(001) surface prepared in a molecular-beam epitaxy chamber: a scanning tunneling microscopy study cond-mat.mtrl-sci · 2009 · author #3
  34. Capacitance investigation of Ge nanoclusters on a silicon (001) surface grown by MBE at low temperatures cond-mat.mes-hall · 2009 · author #7
  35. Defects of Ge quantum dot arrays on the Si(001) surface cond-mat.mtrl-sci · 2009 · author #1

Mentions

  • 1503.05700 #1 · backfill · confidence 0.70 V. A. Yuryev
  • 1310.6634 #3 · backfill · confidence 0.70 V. A. Yuryev
  • 1304.0955 #10 · backfill · confidence 0.70 V. A. Yuryev
  • 1301.7010 #6 · backfill · confidence 0.70 V. A. Yuryev
  • 1208.6147 #3 · backfill · confidence 0.70 V. A. Yuryev
  • 1204.2509 #1 · backfill · confidence 0.70 V. A. Yuryev
  • 1204.1297 #5 · backfill · confidence 0.70 V. A. Yuryev
  • 1203.5631 #1 · backfill · confidence 0.70 V. A. Yuryev
  • 1202.6224 #6 · backfill · confidence 0.70 V. A. Yuryev
  • 1106.1327 #2 · backfill · confidence 0.70 V. A. Yuryev
  • 1106.1202 #3 · backfill · confidence 0.70 V. A. Yuryev
  • 1106.1128 #4 · backfill · confidence 0.70 V. A. Yuryev
  • 1106.0754 #3 · backfill · confidence 0.70 V. A. Yuryev
  • 1106.0753 #1 · backfill · confidence 0.70 V. A. Yuryev
  • 1106.0751 #3 · backfill · confidence 0.70 V. A. Yuryev
  • 1105.6012 #1 · backfill · confidence 0.70 V. A. Yuryev
  • 1101.3527 #3 · backfill · confidence 0.70 V. A. Yuryev
  • 1010.1927 #7 · backfill · confidence 0.70 V. A. Yuryev
  • 1010.1452 #3 · backfill · confidence 0.70 V. A. Yuryev
  • 1009.3909 #2 · backfill · confidence 0.70 V. A. Yuryev
  • 1009.3831 #2 · backfill · confidence 0.70 V. A. Yuryev
  • 1008.4694 #3 · backfill · confidence 0.70 V. A. Yuryev
  • 1008.4534 #5 · backfill · confidence 0.70 V. A. Yuryev
  • 1008.4057 #3 · backfill · confidence 0.70 V. A. Yuryev
  • 1008.4050 #3 · backfill · confidence 0.70 V. A. Yuryev
  • 1008.1772 #2 · backfill · confidence 0.70 V. A. Yuryev
  • 1007.0329 #2 · backfill · confidence 0.70 V. A. Yuryev
  • 0908.1378 #7 · backfill · confidence 0.70 V. A. Yuryev
  • 0908.1346 #3 · backfill · confidence 0.70 V. A. Yuryev
  • 0908.1287 #7 · backfill · confidence 0.70 V. A. Yuryev
  • 0908.0841 #1 · backfill · confidence 0.70 V. A. Yuryev

Frequent Coauthors