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V. P. Kalinushkin

Identifiers

  • name variant V. P. Kalinushkin 0.60 · backfill

Papers (19)

  1. Pt silicide/poly-Si Schottky diodes as temperature sensors for bolometers cond-mat.mtrl-sci · 2015 · author #7
  2. Application of Scanning Mid-IR-Laser Microscopy for Characterization of Semiconductor Materials for Photovoltaics cond-mat.mtrl-sci · 2013 · author #1
  3. Investigation of quantum-dimensional structure parameters by X-ray optical, scanning tunneling and transmission electron microscopy cond-mat.mtrl-sci · 2013 · author #7
  4. Metal silicide/poly-Si Schottky diodes for uncooled microbolometers cond-mat.mtrl-sci · 2013 · author #3
  5. Ge/Si(001) heterostructures with dense arrays of Ge quantum dots: morphology, defects, photo-emf spectra and terahertz conductivity cond-mat.mtrl-sci · 2012 · author #7
  6. Ge/Si(001) Heterostructures with Quantum Dots: Formation, Defects, Photo-Electromotive Force and Terahertz Conductivity cond-mat.mtrl-sci · 2012 · author #7
  7. Application of elastic mid-IR-laser-light scattering for non-destructive inspection in microelectronics cond-mat.mtrl-sci · 2011 · author #1
  8. Large-scale defect accumulations in Czochralski-grown silicon cond-mat.mtrl-sci · 2011 · author #1
  9. Application of elastic mid-IR light scattering for inspection of internal gettering operations cond-mat.mtrl-sci · 2011 · author #3
  10. Optical beam-induced scattering mode of mid-IR laser microscopy: a method for defect investigation in near-surface and near-interface regions of bulk semiconductors cond-mat.mtrl-sci · 2011 · author #2
  11. Influence of photoexcitation depth on luminescence spectra of bulk GaAs single crystals: application to defect structure characterization cond-mat.mtrl-sci · 2011 · author #2
  12. Mid-IR-laser microscopy as a tool for defect investigation in bulk semiconductors cond-mat.mtrl-sci · 2011 · author #2
  13. Absorption of Terahertz Radiation in Ge/Si(001) Heterostructures with Quantum Dots cond-mat.mes-hall · 2011 · author #7
  14. On the nature of large-scale defect accumulations in Czochralski-grown silicon cond-mat.mtrl-sci · 2010 · author #1
  15. Possibilities of application of elastic mid-IR light scattering for inspection of internal gettering operations cond-mat.mtrl-sci · 2010 · author #3
  16. Scanning mid-IR-laser microscopy: an efficient tool for materials studies in silicon-based photonics and photovoltaics cond-mat.mtrl-sci · 2010 · author #2
  17. Application of scanning mid-IR-laser microscopy for characterization of semiconductor materials for photovoltaics cond-mat.mtrl-sci · 2010 · author #1
  18. Elastic Mid-Infrared Light Scattering: a Basis for Microscopy of Large-Scale Electrically Active Defects in Semiconducting Materials cond-mat.mtrl-sci · 2010 · author #1
  19. Capacitance investigation of Ge nanoclusters on a silicon (001) surface grown by MBE at low temperatures cond-mat.mes-hall · 2009 · author #6

Mentions

  • 1503.05700 #7 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1310.6634 #1 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1304.0955 #7 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1301.7010 #3 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1204.2509 #7 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1203.5631 #7 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1106.1327 #1 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1106.1202 #1 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1106.1128 #3 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1106.0754 #2 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1106.0753 #2 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1106.0751 #2 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1101.3527 #7 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1008.4694 #1 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1008.4534 #3 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1008.4057 #2 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1008.4050 #1 · backfill · confidence 0.70 V. P. Kalinushkin
  • 1008.1772 #1 · backfill · confidence 0.70 V. P. Kalinushkin
  • 0908.1287 #6 · backfill · confidence 0.70 V. P. Kalinushkin

Frequent Coauthors